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90° SAE FLANGE 3000 P.S.I.

ZnSe CF3-3/8″ vacuum viewport AR coated at 7-14 um sales@dmphotonics.com

ITEM:
HOUSING OR FLANGE TYPE& SIZE: ConFlat 3-3/8 inch CF flange
CLEAR APERATURE SIZE FOR THE WINDOW: (maximum possible) 35mm
HOUSING OR FLANGE TYPE/MATERIAL: Stainless Steel 304
MAX. TEMPERATURE: 35 C deg
MIN. TEMPERATURE: 25 C deg
WILL BE USED FOR INTERNAL OR EXTERNAL PRESSURE (vacuum is considered as external): EXTERNAL
MAX. PRESSURE: 5 PSI
MIN. PRESSURE: -14.7 PSI
WAVELENGTH TRANSMITTED: 7-14 microns
WINDOW MATERIAL: ZnSe optical grade
ANY COATING ON WINDOW/TYPE/WHICH SIDE: Both sides BBAR at 7-14 microns

Del Mar Photonics offer a range of competitively priced UHV viewports , Conflat, ISO or KF including a variety of coatings to enhance performance.

https://www.dmphotonics.com/Zinc-selenide-ZnSe-vacuum-viewport/vacuum-viewports-ZnSe.htm

Featured application:
Free electron laser
A free-electron laser (FEL), is a type of laser that shares the same optical properties as conventional lasers such as emitting a beam consisting of coherent electromagnetic radiation that can reach high power, but that uses some very different operating principles to form the beam. Unlike gas-, liquid-, or solid-state lasers such as diode lasers, in which electrons are excited in bound atomic or molecular states, free-electron lasers use a relativistic electron beam that moves freely through a magnetic structure, hence the term free electron as the lasing medium. The free-electron laser has the widest frequency range of any laser type, and can be widely tunable, currently ranging in wavelength from microwaves, through terahertz radiation and infrared, to the visible spectrum, to ultraviolet, to X-rays.

Featured presenations at SPIE Optics + Photonics 2013
Insights into electron and hole extraction layers for upright and inverted vacuum-deposited small molecule organic solar cells
Graeme M. Williams, Hany Aziz
28 August 2013 5:30 – 7:30 PM

Test-validated alignment and stability performance of the JMAPS program focal plane array assembly in a cryogenic vacuum environment
Brian Thompson, Pedro Sevilla, Michael Watson, Trent Newswander, Duane Miles, James Peterson
29 August 2013 1:00 – 1:20 PM

Further results in measuring water ice buildup on optical components in cryogenic vacuum chambers
Trevor M. Moeller, L. M. Smith, Frank G. Collins, James P. Rogers, Jesse M. Labello, Heard S. Lowry, Dustin H. Crider
27 August 2013 9:20 – 9:40 AM

Fundamental properties of vacuum-deposited amorphous organic semiconductor films: density, molecular orientation, and refractive index
Daisuke Yokoyama
25 August 2013 1:50 – 2:10 PM

SiC multi-layer protective coating on carbon obtained by thermionic vacuum arc method
Victor Ciupina, Cristian P. Lungu, Rodica Vladoiu, Danut Tiberius Epure, Gabriel Prodan, Cosmin Rosca, Corneliu Porosnicu, Ionut Jepu, Marius Belc, Madalina Prodan, Iuliana M. Stanescu, Constanta Stefanov, Mirela Contulov, Aurelia Mandes, Virginia Dinca, Eugenia Vasile, Valer Zaroschi, Virginia Nicolescu
28 August 2013 10:30 – 10:50 AM

Transmission imaging of sodium in the vacuum ultra-violet spectral range: new application for an intense VUV source
Hiroyuki Daido
27 August 2013 11:20 – 11:40 AM

Recent progress on the vacuum deposition of OLEDs with feature sizes≤ 20 μm using a contact shadow mask patterned in-situ by laser ablation
Yoshitaka Kajiyama, Kevin A. J. Joseph, Koichi Kajiyama, Syuji Kudo, Hany Aziz
26 August 2013 5:00 – 5:15 PM

Vacuum-packaged infrared MEMS image sensor array
Jae Hong Park
26 August 2013 5:30 – 7:30 PM

Micromanipulation of multiple trapped, rotating particles in vacuum
Sayantan Ghosh, Yoshihiko Arita, Tom Vettenburg, Michael Mazilu, Kishan Dholakia
25 August 2013 2:00 – 2:20 PM

SNR parameter test system of MCP In vacuum system
Yafeng Qiu
27 August 2013 8:40 – 9:00 AM

Realisation of a microscopic gyroscope by an optically trapped rotating microparticle in vacuum
Yoshihiko Arita, Michael Mazilu, Kishan Dholakia
25 August 2013 1:40 – 2:00 PM

Development of an in-vacuum x-ray microscope with cryogenic sample cooling for beamline P11 at PETRA III
Alke F. Meents, Bernd Reime, Nicolas Stuebe, Pontus Fischer, Martin Warmer, Dennis Goeries, Jan Roever, Jan Meyer, Ismo J. Vartiainen, Christian David
29 August 2013 9:00 – 9:20 AM

Carrier-gas enhanced vapor phase deposition for organic thin films: addressing mass manufacturing requirements for OLEDs and overcoming existing challenges with OVPD
Juergen Kreis, Markus Schwambera, Dietmar Keiper, Markus Gersdorff, Michael Long, Michael Heuken
27 August 2013 8:50 – 9:10 AM

The electrostatic to gravitational force ratio within the Electro-Gravi-Magnetic (EGM) construct
Riccardo C. Storti
27 August 2013 1:30 – 2:00 PM

https://www.dmphotonics.com/Zinc-Selenide/ZnSe-rhomb.htm

LBT 243 / with Jim Wilson / In this tip clip from the Quick Check Diagnostics class, instructor Jim Wilson talks about some simple test you can perform to verify proper functionality of the PCV valve. He goes on to discuss what to watch out for and how fuel trim can be effected.