Fast delivery for 87643-Interlock Hose Fitting Export to Malaysia

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45° SAE FLANGE 6000 P.S.I.   PART NUMBER HOSE FLANGE   B mm L mm D mm  M mm  S mm   DN In SIZE             H876C0 – 10 – 12 16 5/8″ 10 3/4″ 18 61,9 41,3 28 8,76 H876C0 – 12 – 12 20 3/4″ 12 3/4″ 18 69,9 41,3 30,5 8,76 H876C0 – 12 – 16 20 3/4″ 12 1″ 23 72,6 47,6 33,3 9,53 H876C0 – 16 – 16 25 1″ 16 1″ 23 85,5 47,6 37,5 9,53 H876C0 – 16 ...


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We have a professional, efficiency team to provide quality service for our customer. We always follow the tenet of customer-oriented, details-focused for Hose Fittings Amazon, Split Flanges Wholesale, Weld Fitting Weight Chart, Welcome you to join us together to make your business easier. We are always your best partner when you want to have your own business.
Fast delivery for 87643-Interlock Hose Fitting Export to Malaysia Detail:

45° SAE FLANGE 6000 P.S.I.

26

 

PART NUMBER

HOSE

FLANGE

 

B

mm

L

mm

D

mm

 M

mm

 S

mm

 

DN

In

SIZE

 

 

 

 

 

 

H876C0 – 10 – 12 16 5/8″ 10 3/4″ 18 61,9 41,3 28 8,76
H876C0 – 12 – 12 20 3/4″ 12 3/4″ 18 69,9 41,3 30,5 8,76
H876C0 – 12 – 16 20 3/4″ 12 1″ 23 72,6 47,6 33,3 9,53
H876C0 – 16 – 16 25 1″ 16 1″ 23 85,5 47,6 37,5 9,53
H876C0 – 16 – 20 25 1″ 16 1.1/4″ 30 87,9 54 40,1 10,29
H876C0 – 20 – 20 32 1.1/4″ 20 1.1/4″ 30 100,2 54 43 10,29
H876C0 – 20 – 24 32 1.1/4″ 20 1.1/2″ 36 105,1 63,5 47,9 12,57
H876C0 – 24 – 24 40 1.1/2″ 24 1.1/2″ 36 113 63,5 51,8 12,57
H876C0 – 24 – 32 40 1.1/2″ 24 2″ 48 120,4 79,4 59,2 12,57
H876C0 – 32 – 32 50 2″ 32 2″ 48 150,8 79,4 67,8 12,57

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  • ZnSe CF3-3/8″ vacuum viewport AR coated at 7-14 um sales@dmphotonics.com

    ITEM:
    HOUSING OR FLANGE TYPE& SIZE: ConFlat 3-3/8 inch CF flange
    CLEAR APERATURE SIZE FOR THE WINDOW: (maximum possible) 35mm
    HOUSING OR FLANGE TYPE/MATERIAL: Stainless Steel 304
    MAX. TEMPERATURE: 35 C deg
    MIN. TEMPERATURE: 25 C deg
    WILL BE USED FOR INTERNAL OR EXTERNAL PRESSURE (vacuum is considered as external): EXTERNAL
    MAX. PRESSURE: 5 PSI
    MIN. PRESSURE: -14.7 PSI
    WAVELENGTH TRANSMITTED: 7-14 microns
    WINDOW MATERIAL: ZnSe optical grade
    ANY COATING ON WINDOW/TYPE/WHICH SIDE: Both sides BBAR at 7-14 microns

    Del Mar Photonics offer a range of competitively priced UHV viewports , Conflat, ISO or KF including a variety of coatings to enhance performance.

    https://www.dmphotonics.com/Zinc-selenide-ZnSe-vacuum-viewport/vacuum-viewports-ZnSe.htm

    Featured application:
    Free electron laser
    A free-electron laser (FEL), is a type of laser that shares the same optical properties as conventional lasers such as emitting a beam consisting of coherent electromagnetic radiation that can reach high power, but that uses some very different operating principles to form the beam. Unlike gas-, liquid-, or solid-state lasers such as diode lasers, in which electrons are excited in bound atomic or molecular states, free-electron lasers use a relativistic electron beam that moves freely through a magnetic structure, hence the term free electron as the lasing medium. The free-electron laser has the widest frequency range of any laser type, and can be widely tunable, currently ranging in wavelength from microwaves, through terahertz radiation and infrared, to the visible spectrum, to ultraviolet, to X-rays.

    Featured presenations at SPIE Optics + Photonics 2013
    Insights into electron and hole extraction layers for upright and inverted vacuum-deposited small molecule organic solar cells
    Graeme M. Williams, Hany Aziz
    28 August 2013 5:30 – 7:30 PM

    Test-validated alignment and stability performance of the JMAPS program focal plane array assembly in a cryogenic vacuum environment
    Brian Thompson, Pedro Sevilla, Michael Watson, Trent Newswander, Duane Miles, James Peterson
    29 August 2013 1:00 – 1:20 PM

    Further results in measuring water ice buildup on optical components in cryogenic vacuum chambers
    Trevor M. Moeller, L. M. Smith, Frank G. Collins, James P. Rogers, Jesse M. Labello, Heard S. Lowry, Dustin H. Crider
    27 August 2013 9:20 – 9:40 AM

    Fundamental properties of vacuum-deposited amorphous organic semiconductor films: density, molecular orientation, and refractive index
    Daisuke Yokoyama
    25 August 2013 1:50 – 2:10 PM

    SiC multi-layer protective coating on carbon obtained by thermionic vacuum arc method
    Victor Ciupina, Cristian P. Lungu, Rodica Vladoiu, Danut Tiberius Epure, Gabriel Prodan, Cosmin Rosca, Corneliu Porosnicu, Ionut Jepu, Marius Belc, Madalina Prodan, Iuliana M. Stanescu, Constanta Stefanov, Mirela Contulov, Aurelia Mandes, Virginia Dinca, Eugenia Vasile, Valer Zaroschi, Virginia Nicolescu
    28 August 2013 10:30 – 10:50 AM

    Transmission imaging of sodium in the vacuum ultra-violet spectral range: new application for an intense VUV source
    Hiroyuki Daido
    27 August 2013 11:20 – 11:40 AM

    Recent progress on the vacuum deposition of OLEDs with feature sizes≤ 20 μm using a contact shadow mask patterned in-situ by laser ablation
    Yoshitaka Kajiyama, Kevin A. J. Joseph, Koichi Kajiyama, Syuji Kudo, Hany Aziz
    26 August 2013 5:00 – 5:15 PM

    Vacuum-packaged infrared MEMS image sensor array
    Jae Hong Park
    26 August 2013 5:30 – 7:30 PM

    Micromanipulation of multiple trapped, rotating particles in vacuum
    Sayantan Ghosh, Yoshihiko Arita, Tom Vettenburg, Michael Mazilu, Kishan Dholakia
    25 August 2013 2:00 – 2:20 PM

    SNR parameter test system of MCP In vacuum system
    Yafeng Qiu
    27 August 2013 8:40 – 9:00 AM

    Realisation of a microscopic gyroscope by an optically trapped rotating microparticle in vacuum
    Yoshihiko Arita, Michael Mazilu, Kishan Dholakia
    25 August 2013 1:40 – 2:00 PM

    Development of an in-vacuum x-ray microscope with cryogenic sample cooling for beamline P11 at PETRA III
    Alke F. Meents, Bernd Reime, Nicolas Stuebe, Pontus Fischer, Martin Warmer, Dennis Goeries, Jan Roever, Jan Meyer, Ismo J. Vartiainen, Christian David
    29 August 2013 9:00 – 9:20 AM

    Carrier-gas enhanced vapor phase deposition for organic thin films: addressing mass manufacturing requirements for OLEDs and overcoming existing challenges with OVPD
    Juergen Kreis, Markus Schwambera, Dietmar Keiper, Markus Gersdorff, Michael Long, Michael Heuken
    27 August 2013 8:50 – 9:10 AM

    The electrostatic to gravitational force ratio within the Electro-Gravi-Magnetic (EGM) construct
    Riccardo C. Storti
    27 August 2013 1:30 – 2:00 PM

    https://www.dmphotonics.com/Zinc-Selenide/ZnSe-rhomb.htm



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